Configurable workstation combining spectral attenuation, mode field diameter, effective area and cut-off wavelength in one characterization sequence. NOT named in the client brief - included because it is a current PFO product.
| Product | Standard measurement types | Spectral coverage (broad-band SLED sources) | Numerical aperture option - LED wavelength | Secondary light source | MFD measurement method | Standards compliance |
|---|---|---|---|---|---|---|
| WS500 | Spectral attenuation, mode field diameter (MFD), effective area (Aeff), cut-off wavelength | 1250-1650 nm | 850 nm | Low power tungsten lamp | Far-field scanner | IEC-60793-1-40, IEC-60793-1-43, IEC-60793-1-44, IEC-60793-1-45, IEC-60793-1-47, IEC-60793-2-50 (C5), IEC-TR-62284, ITU G650.1, ITU G650.2 |
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Our application engineers will confirm specifications with the manufacturer and quote for your configuration.
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