A0070A Optical Frequency Analyzer
An analyzer that displays the optical frequency modulation waveform of an FMCW LiDAR laser in real time, like an oscilloscope, in both the time and frequency domains. SYCATUS states the method extracts only the frequency modulation component, so intensity modulation does not affect the trace.
Technical overview
FMCW LiDAR relies on a triangular optical frequency sweep, and directly modulating a semiconductor laser modulates its intensity as well as its frequency, so the sweep must be observed in the time domain without intensity crosstalk. The A0070A uses a SYCATUS test set and software with a Keysight signal analyzer and VSA software to show that waveform directly. SYCATUS states no adjustment is needed before measurement and that trace noise is low enough that averaging is not required. The A0070A can also be ordered as an option to the A0040A Optical Noise Analyzer so that frequency modulation and frequency noise are measured in one system.
Features
- Time-domain waveform and frequency-domain spectrum of optical frequency modulation
- Real-time time-domain waveform measurement, like an oscilloscope
- Unaffected by intensity modulation of the laser signal
- Low trace noise without averaging
- High measurement accuracy with low trace noise and high linearity
- Easy measurement without prior adjustment
- Integratable into the A0040A Optical Noise Analyzer
Specifications
| Parameter | Value |
|---|---|
| Optical wavelength range | 1520 to 1620 nm |
| Optical frequency modulation repetition rate, max. | 370 kHz |
| Optical frequency deviation, max. (repetition rate 10 kHz) | 560 GHz p-p |
| Optical frequency deviation, max. (repetition rate 100 kHz) | 56 GHz p-p |
Applications
- Evaluation of lasers for FMCW LiDAR
- Optical frequency modulation waveform and spectrum measurement
- Development and manufacturing of directly modulated semiconductor lasers for coherent ranging
- Combined frequency modulation and frequency noise evaluation when added to the A0040A
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